发明名称 SPECTROSCOPIC MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a spectroscopic measurement device capable of achieving high sensitivity, high resolution, a wide tuning wavelength region and high frequency decision accuracy by a simple structure, even when a spectral intensity is low.SOLUTION: A spectroscopic measurement device comprises: a first laser light source 30 that generates a first laser beam; a second laser light source 31 that generates a second laser beam; a nonlinear optical crystal 50 that, when the first laser beam and the second laser beam are made incident, generates difference frequency light between the first laser beam and the second laser beam; an optical resonator 60 that is set to resonate with the difference frequency light of a predetermined frequency when the difference frequency light of the predetermined frequency is made incident; and an optical frequency com 20 that is used for stabilizing at least one of the first laser beam and the second laser beam so that the difference frequency light between the first laser beam and the second laser beam matches the predetermined frequency.
申请公布号 JP2013224826(A) 申请公布日期 2013.10.31
申请号 JP20120095961 申请日期 2012.04.19
申请人 KEIO GIJUKU 发明人 SASADA HIROYUKI;OKUBO AKIRA;IWAKUNI KANA
分类号 G01J9/00;G02F1/37 主分类号 G01J9/00
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