| 摘要 |
PROBLEM TO BE SOLVED: To provide a microspectroscopic reflectance measurement machine capable of easily placing even a specimen having a spherical measuring plane with small curvature radius, in a state favorably performing a reflectance measurement.SOLUTION: The microspectroscopic reflectance measurement machine causes light emitted from a light source to enter a measuring plane as a measuring light flux, and measures spectral distribution of the reflected light flux formed by the measuring light flux reflected from the measuring plane. The microspectroscopic reflectance measurement machine includes: a stage 8 that has an edge 8b coming into contact with the measuring plane and on which a specimen is placed; and an observation optical system that acquires an image including an image of the reflection light flux. The edge 8b is disposed on a circumference of a same circle. The stage 8 is mounted such that the circle orthogonally crosses with an optical axis of the measurement light flux and that the center of the circle is located on the optical axis. |
