发明名称 SCANNING ELECTRON MICROSCOPE
摘要 With a scanning electron microscope (SEM) adopting a commonly available exhaust system such as a turbo-molecular pump, an ion pump, or a rotary pump, and so forth, there is realized an apparatus capable of safely executing observation, or adsorption of a target substance that is high in rarity. Further, there is realized a safe SEM low in the risk of an electrical discharge by providing the apparatus with a probe, a means for replacing an atmosphere in a specimen chamber, with a predetermined gas, and a means for forming an image by detection of an ion current, and detection of an absorption current. Further, there is provided a means for controlling the polarity of a voltage applied to the probe. Still further, there is provided a control means for controlling a value of the voltage applied to the probe according to a degree of vacuum.
申请公布号 US2013284923(A1) 申请公布日期 2013.10.31
申请号 US201113994811 申请日期 2011.11.02
申请人 HATANO HARUHIKO;SUZUKI HIROYUKI;NAKAYAMA YOSHIHIKO;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 HATANO HARUHIKO;SUZUKI HIROYUKI;NAKAYAMA YOSHIHIKO
分类号 H01J37/18 主分类号 H01J37/18
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