TEST SUPPORT METHOD, TEST SUPPORT PROGRAM, AND TEST SUPPORT DEVICE

摘要

PROBLEM TO BE SOLVED: To facilitate determining whether a defect in power supply wiring has occurred in a semiconductor integrated circuit.SOLUTION: A test support device 100 specifies cells within first circuit information 101, which indicate elements where a failure may occur due to a defect at a specific position of power supply wiring within the semiconductor integrated circuit 103, and the kinds of failures, in the first circuit information 101 that indicates a connection relationship of elements within the semiconductor integrated circuit 103. The test support device 100 provides a simulator with the first circuit information 101 after failure models associated with the kinds of failures for the specified cells are set and a test pattern t1, so as to execute simulation. The test support device 100 obtains a result of a test that is performed by providing the test pattern t1 to the semiconductor integrated circuit 103. The test support device 100 determines whether a second simulation result 102 and a test result 1000 match with each other.