发明名称 |
Method and System for Correlated Tracing with Automated Multi-Layer Function Instrumentation Localization |
摘要 |
A system for automatically instrumenting and tracing an application program and related software components achieves a correlated tracing of the program execution. It includes tracing of endpoints that are the set of functions in the program execution path that the developers are interested. The tracing endpoints and related events become the total set of functions to be traced in the program (called instrument points). This invention automatically analyzes the program and generates such instrumentation points to enable correlated tracing. The generated set of instrumentation points addresses common questions that developers ask when they use monitoring tools.
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申请公布号 |
US2013290936(A1) |
申请公布日期 |
2013.10.31 |
申请号 |
US201313873610 |
申请日期 |
2013.04.30 |
申请人 |
NEC LABORATORIES AMERICA, INC. |
发明人 |
RHEE JUNGHWAN;ZHANG HUI;ARORA NIPUN;JIANG GUOFEI;YOSHIHIRA KENJI;SONG MYOUNGKU |
分类号 |
G06F11/36 |
主分类号 |
G06F11/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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