发明名称 SOI DEVICE WITH DTI AND STI
摘要 A method of forming an SOI structure which includes providing a semiconductor on insulator (SOI) substrate having an SOI layer, an intermediate buried oxide (BOX) layer and a bottom substrate; patterning the SOI layer to form first and second openings in the SOI layer; extending the first openings into the bottom substrate; enlarging the first openings within the bottom substrate; filling the first and second openings with an insulator material to form deep trench isolations (DTIs) from the first openings and shallow trench isolations (STIs) from the second openings; implanting in the bottom substrate between the DTIs to form wells; and forming semiconductor devices in the SOI layer between the DTIs with each semiconductor device being separated from an adjacent semiconductor device by an STI.
申请公布号 US2013288451(A1) 申请公布日期 2013.10.31
申请号 US201313924851 申请日期 2013.06.24
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG KANGGUO;DORIS BRUCE B.;KHAKIFIROOZ ALI;KERBER PRANITA
分类号 H01L21/762 主分类号 H01L21/762
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