发明名称 METHOD OF DEPOSITING SILICONE DIOXIDE FILMS
摘要 The invention relates to a method of depositing silicon dioxide films using plasma enhanced chemical vapour deposition (PECVD) and more particularly using tetraethyl orthosilicate (TEOS). The process can be carried out at standard temperatures and also at low temperatures which is useful for manufacturing wafers with through silicon vias.
申请公布号 US2013288486(A1) 申请公布日期 2013.10.31
申请号 US201313869369 申请日期 2013.04.24
申请人 SPTS TECHNOLOGIES LIMITED 发明人 CROOK KATHRINE;PRICE ANDREW;CARRUTHERS MARK;ARCHARD DANIEL;BURGESS STEPHEN
分类号 H01L21/02 主分类号 H01L21/02
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