| 摘要 |
<p>Provided are a method of evaluating an end surface of a glass substrate, which is capable of accurately evaluating properties and a state of the end surface of the glass substrate, a method of processing the end surface of the glass substrate on the basis of this evaluation method, and a glass substrate in which dust adhesion to the end surface of the glass substrate may be reduced on the basis of the processing method, and more particularly, a glass substrate in which defects such as burning defect, chipping, and cracking may be prevented from occurring on a chamfered surface on the basis of the processing method. According to the invention, an image of the end surface Z, which is imaged by a laser microscope 14, is processed with white and black binarization to identify a recess present in the end surface and a mirror surface of the end surface as a white image and a black image, respectively, and then the properties and state of the end surface of the glass substrate are evaluated on the basis of a ratio of an area of the white image with respect to an area of the black image. According to this evaluation method, compared to an evaluation method in which reliability of a degree of precision greatly depends on the size of the recess that is present in the end surface Z, the properties and state of the end surface Z of the glass substrate G may be evaluated in a relatively accurate manner.</p> |
