发明名称 Method of production of a field effect transistor with local source/drain insulation
摘要 Field effect transistor comprises a semiconductor substrate (1), a source recess (SV) and a drain recess (DV) formed in the substrate, a recessed insulating layer (VI) formed in the base region of the source and drain recess, an electrically conducting filler layer (F) formed on the surface of the insulating layer, a gate dielectric (3) formed on the substrate surface between the source and drain recesses, and a gate layer (4) formed on the surface of the gate dielectric. An independent claim is also included for a process for the production of a field effect transistor.
申请公布号 EP2657961(A1) 申请公布日期 2013.10.30
申请号 EP20130177706 申请日期 2003.09.19
申请人 INFINEON TECHNOLOGIES AG 发明人 HOLZ, JUERGEN;SCHRUEFER, KLAUS;TEWS, HELMUT
分类号 H01L21/336;H01L29/06;H01L29/417;H01L29/66;H01L29/78 主分类号 H01L21/336
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