发明名称 |
POSITION MEASURING APPARATUS, PATTERN TRANSFER APPARATUS, AND METHOD FOR MANUFACTURING A DEVICE |
摘要 |
PURPOSE: A position measuring apparatus is provided to improve the measuring accuracy by reducing deformation to the plate width direction of a scale. CONSTITUTION: A position measuring apparatus is composed to measure the position of an object by using a scale of a plate form including a grid pattern. The position measuring apparatus comprises a support unit arranged between a structure and the scale to support the scale. The support unit comprises a spring element reducing the vibration delivered from the structure to the scale in the plate thickness direction. A pattern transfer apparatus is composed to transfer a pattern on a substrate. The pattern transfer apparatus comprises a moving member composed to mount the substrate and move, and a position measuring apparatus composed to measure the position of the moving member by using a scale of a plate form including a grid pattern. |
申请公布号 |
KR20130118810(A) |
申请公布日期 |
2013.10.30 |
申请号 |
KR20130043332 |
申请日期 |
2013.04.19 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
EMOTO KEIJI;MARUYAMA NAOKI |
分类号 |
G03F7/20;G01B7/00;H01L21/027;H01L21/68 |
主分类号 |
G03F7/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|