发明名称 POSITION MEASURING APPARATUS, PATTERN TRANSFER APPARATUS, AND METHOD FOR MANUFACTURING A DEVICE
摘要 PURPOSE: A position measuring apparatus is provided to improve the measuring accuracy by reducing deformation to the plate width direction of a scale. CONSTITUTION: A position measuring apparatus is composed to measure the position of an object by using a scale of a plate form including a grid pattern. The position measuring apparatus comprises a support unit arranged between a structure and the scale to support the scale. The support unit comprises a spring element reducing the vibration delivered from the structure to the scale in the plate thickness direction. A pattern transfer apparatus is composed to transfer a pattern on a substrate. The pattern transfer apparatus comprises a moving member composed to mount the substrate and move, and a position measuring apparatus composed to measure the position of the moving member by using a scale of a plate form including a grid pattern.
申请公布号 KR20130118810(A) 申请公布日期 2013.10.30
申请号 KR20130043332 申请日期 2013.04.19
申请人 CANON KABUSHIKI KAISHA 发明人 EMOTO KEIJI;MARUYAMA NAOKI
分类号 G03F7/20;G01B7/00;H01L21/027;H01L21/68 主分类号 G03F7/20
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