| 摘要 |
A micrometer (1) includes: a frame (10); an anvil (11); a spindle (20); an encoder (40); a display (60); a strain gauge (50) that detects a deformation of the frame; a storage that stores a change amount of the detection value (a displacement of the spindle detected by the encoder) per a unit deformation detected by the strain gauge, as a compensation factor; and a compensator that compensates the detection value based on a difference between a zeroset-time deformation that is detected by the strain gauge when a command for zeroset is given and a measurement-time deformation that is detected by the strain gauge in measurement, and based on the compensation factor stored in the storage. |
