发明名称 Dual-metal self-aligned wires and vias
摘要 Method of forming a semiconductor structure which includes forming first conductive spacers on a semiconductor substrate; forming second conductive spacers with respect to the first conductive spacers, at least one of the second conductive spacers adjacent to and in contact with each of the first conductive spacers to form combined conductive spacers; recessing the second conductive spacers with respect to the first conductive spacers so that the first conductive spacers extend beyond the second conductive spacers; depositing an ILD to cover the first and second spacers except for an exposed edge of the first conductive spacers; patterning the exposed edges of the first conductive spacers to recess the edges of the first conductive spacers in predetermined locations to form recesses with respect to the ILD; and filling the recesses with an insulating material to leave unrecessed edges of the first conductive spacers as vias to subsequent wiring features.
申请公布号 US8569168(B2) 申请公布日期 2013.10.29
申请号 US201213371493 申请日期 2012.02.13
申请人 HOLMES STEVEN J.;HORAK DAVID V.;KOBURGER, III CHARLES W.;PONOTH SHOM;YANG CHIH-CHAO;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HOLMES STEVEN J.;HORAK DAVID V.;KOBURGER, III CHARLES W.;PONOTH SHOM;YANG CHIH-CHAO
分类号 H01L21/44 主分类号 H01L21/44
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