发明名称 Semiconductor device and method for fabricating the same
摘要 A method for fabricating a semiconductor device is described. A substrate having thereon a polysilicon resistor is provided. A dielectric layer is formed over the substrate covering the polysilicon resistor. The dielectric layer is etched to form a contact opening over the polysilicon resistor, with overetching into the polysilicon resistor. A metal silicide layer is formed on the polysilicon resistor in the contact opening. A metal material is filled in the contact opening. A portion of the dielectric layer, the metal material, and a portion of the polysilicon resistor are removed to expose the metal silicide layer. A metal contact is formed over the metal silicide layer.
申请公布号 US8569127(B2) 申请公布日期 2013.10.29
申请号 US201213418835 申请日期 2012.03.13
申请人 CHEN CHIEN-YANG;TSAI CHEN-HUA;HONG SHIH-FANG;TSAO PO-CHAO;WEI MING-TE;UNITED MICROELECTRONICS CORP. 发明人 CHEN CHIEN-YANG;TSAI CHEN-HUA;HONG SHIH-FANG;TSAO PO-CHAO;WEI MING-TE
分类号 H01L21/8238;H01L21/00 主分类号 H01L21/8238
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