发明名称 Polysilicon resistor formation in a gate-last process
摘要 A method includes forming a polysilicon layer over a substrate, forming a hard mask over the polysilicon layer, and doping a first portion of the hard mask with a dopant to form a doped hard mask region, wherein a second portion of the hard mask is not doped with the dopant. An etching step is performed to etch the first and the second portions of the hard mask, wherein the second portion of the hard mask is removed, and wherein at least a bottom portion of the doped hard mask region is not removed. After the etching step, the bottom portion of the doped hard mask region is removed. Electrical connections are formed to connect to a portion of the polysilicon layer in order to form a resistor.
申请公布号 US8569141(B2) 申请公布日期 2013.10.29
申请号 US201113222181 申请日期 2011.08.31
申请人 HUANG CHUN-HUNG;CHEN JYH-HUEI;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG CHUN-HUNG;CHEN JYH-HUEI
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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