发明名称 |
SALT AND PHOTORESIST COMPOSITION COMPRISING THE SAME |
摘要 |
<p>PURPOSE: A photoresist composition provides a photoresist pattern with excellent line edge roughness. CONSTITUTION: A salt is represented by chemical formula 1. In chemical formula 1 Q^1 and Q^2 are a fluorine atom or a C1-6 perfluoroalkyl group; L^1 is a C1-17 divalent saturated hydrocarbon group; L^2 is a single bond or a C1-6 alkanediyl group; Y is a C3-18 aliphatic hydrocarbon group having one or more substituents; Z^+ is an organic counter ion. A photoresist composition comprises an acid generator including the salt and a resin having an acid-labile group which is insoluble to alkali aqueous solution but becomes soluble to alkali aqueous solution by the function of an acid.</p> |
申请公布号 |
KR20130117897(A) |
申请公布日期 |
2013.10.29 |
申请号 |
KR20120020913 |
申请日期 |
2012.02.29 |
申请人 |
SUMITOMO CHEMICAL CO., LTD. |
发明人 |
ICHIKAWA KOJI;SAKAMOTO HIROMU;YASUE TAKAHIRO |
分类号 |
C07C53/138;C07C69/96;G03F7/004 |
主分类号 |
C07C53/138 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|