APPARATUS FOR MEASURING CHARACTERISTICS OF POWER SEMICONDUCTOR

摘要

PURPOSE: A power semiconductor characteristic measuring device is to minimize the volume of the device and to reduce the manufacturing costs. CONSTITUTION: A power semiconductor characteristic measuring device comprises an output transistor (200), a voltage source (300), a first switch (400), a second switch (500) and a pulse generator (600). The output transistor comprises identically with a measurement element (100). The voltage source provides voltage for the gate of the output transistor. The first switch controls power supply to the gate of the output transistor based on driving voltage applied to the measurement element. The second switch measures output current as the gate voltage is changed before measuring the measurement element and corrects the gate voltage of the measurement element. The pulse generator controls currents applied to the measurement element.