发明名称 Methods of fabricating three-dimensional semiconductor device
摘要 A method of fabricating a three-dimensional semiconductor device includes forming a stacked structure, and the stacked structure includes a first layer, a second layer, a third layer, and a fourth layer sequentially stacked on a substrate. The method also includes forming a sacrificial spacer on a sidewall of the stacked structure such that the sacrificial spacer exposes a sidewall of the third layer, and recessing the exposed sidewall of the third layer thereby forming a recess region between the second and fourth layers.
申请公布号 US8569182(B2) 申请公布日期 2013.10.29
申请号 US201213342322 申请日期 2012.01.03
申请人 PARK SANG-YONG;YOUM EUNSUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK SANG-YONG;YOUM EUNSUN
分类号 H01L21/461 主分类号 H01L21/461
代理机构 代理人
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