发明名称 Semiconductor device and manufacturing method thereof
摘要 To provide a semiconductor device that can be manufactured using a simple process without ensuring a high embedding property; and a manufacturing method of the device. In the manufacturing method of the semiconductor device according to the invention, a semiconductor substrate having a configuration obtained by stacking a support substrate, a buried insulating film, and a semiconductor layer in order of mention is prepared first. Then, an element having a conductive portion is completed over the main surface of the semiconductor layer. A trench encompassing the element in a planar view and reaching the buried insulating film from the main surface of the semiconductor layer is formed. A first insulating film (interlayer insulating film) is formed over the element and in the trench to cover the element and form an air gap in the trench, respectively. Then, a contact hole reaching the conductive portion of the element is formed in the first insulating film.
申请公布号 US8569839(B2) 申请公布日期 2013.10.29
申请号 US201113010417 申请日期 2011.01.20
申请人 MORII KATSUMI;OTSU YOSHITAKA;ONISHI KAZUMA;NITTA TETSUYA;SHIROMOTO TATSUYA;TOKUMITSU SHIGEO;RENESAS ELECTRONICS CORPORATION 发明人 MORII KATSUMI;OTSU YOSHITAKA;ONISHI KAZUMA;NITTA TETSUYA;SHIROMOTO TATSUYA;TOKUMITSU SHIGEO
分类号 H01L21/8238;H01L21/70 主分类号 H01L21/8238
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