发明名称 NON-CONTACT DISTORTION MEASURING DEVICE AND NON-CONTACT DISTORTION MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a non-contact distortion measuring device and a non-contact distortion measuring method that secure a sufficient measurement range from an elastic deformation area to a plastic deformation area for one imaging part, and can highly accurately measure distortion at least in the elastic deformation area.SOLUTION: According to the present invention, in image data of a test piece 2 captured by an imaging part 3, two reference points Mand Min an imaging visual field 6 of the imaging part 3 are used as calculation data to calculate a predetermined physical quantity &egr; about distortion of the test piece 2. When at least one of two reference points Mand Mused as the calculation data arrives at a predetermined setting area or a value based on positions of areas of the two reference points arrives at a predetermined setting value, a reference point 23 to be used as the calculation data is switched over to two reference points Mand Mpresent in the imaging visual field 6 and the predetermined physical quantity &egr; is calculated from these switched-over two reference points Mand M.
申请公布号 JP2013221778(A) 申请公布日期 2013.10.28
申请号 JP20120091873 申请日期 2012.04.13
申请人 KOBELCO KAKEN:KK 发明人 YONEDA YASUSHI;NAKAMICHI DAISUKE
分类号 G01B11/16;G01N3/06 主分类号 G01B11/16
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