| 摘要 |
PROBLEM TO BE SOLVED: To complete a calibration operation in a shorter time.SOLUTION: A semiconductor device includes a pull-up impedance code generation section 120 that is a replica of a pull-up output section, and a pull-down impedance code generation section 130 that is a replica of a pull-down output section, and executes calibration actions using the code generation sections 120, 130 in parallel and independently of each other. This can complete a calibration operation in a short time. Even if a clock signal used has a high frequency or if a control code has a large bit number, the calibration operation can be correctly completed within a prescribed period. |
