| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor element handling system capable of preventing work time from being delayed even if difference occurs in time required for performing a loading step, a testing step and an unloading step, respectively.SOLUTION: Between a loading device 3 for performing a loading step for housing a semiconductor element to be tested in a test tray T and an unloading device 4 for performing an unloading step for separating the tested semiconductor element from the test tray T, a plurality of test devices 2 are provided which perform a testing step along a transport device 5. |
