| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor element handling system capable of preventing work time from being delayed even if difference occurs in time required for performing a loading step, a testing step and an unloading step, respectively.SOLUTION: A semiconductor element handling system includes: N pieces (N is an integer larger than 0) of sorting devices 3 for performing a loading step to house a semiconductor element to be tested in a test tray T and an unloading step to separate the tested semiconductor element from the test tray T; and M pieces (M is an integer than N) of testing devices 2 for performing a test step to connect the semiconductor element separated from the sorting device 3 and housed in the test tray T to a test apparatus 200. |
