发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can inhibit an operation of a parasitic bipolar transistor and generate a potential difference between a source region and a back gate region.SOLUTION: A high-voltage transistor NTR formed on a semiconductor substrate SUB comprises a first conductivity type well region LPW, first impurity regions SR each serving as a source region and second impurity regions DR each serving as a drain region. The semiconductor device further comprises a third impurity region PR3 and separation gate electrodes SG. The third impurity region PR3 is formed between a pair of first impurity regions SR in planar view, and is a region for extracting potential of the well region LPW. Each separation gate electrode SG is formed on a principal surface between the first impurity region SR and the third impurity region PR3.
申请公布号 JP2013222871(A) 申请公布日期 2013.10.28
申请号 JP20120094401 申请日期 2012.04.18
申请人 RENESAS ELECTRONICS CORP 发明人 SAYAMA HIROKAZU
分类号 H01L21/336;H01L21/76;H01L21/8238;H01L21/8244;H01L27/092;H01L27/10;H01L27/11;H01L29/41;H01L29/78 主分类号 H01L21/336
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