发明名称 RESISTANCE CHANGE MEMORY DEVICE HAVING THRESHOLD SWITCHING AND MEMORY SWITCHING CHARACTERS, FABRICATION METHOD FOR THE SAME, AND RESISTANCE CHANGE MEMORY DEVICE ARRAY HAVING THE SAME
摘要 <p>PURPOSE: A resistance variation memory device, a manufacturing method, and a resistance variation memory device array are provided to read programmed data by including a hybrid switching film including a switching characteristic and a memory switching characteristic. CONSTITUTION: A plurality of first electrodes (110) is arranged to a first direction on a circuit board (100). An insulation film (120) is formed on the first electrode. A hybrid switching film (135) is arranged between the first electrode and a second electrode (140). The hybrid switching film includes a memory switching film (135b) including a memory switching and a threshold switching film (135a) including a threshold switching characteristic. The threshold switching film includes a metal-insulator transfer characteristic.</p>
申请公布号 KR20130117380(A) 申请公布日期 2013.10.28
申请号 KR20120039566 申请日期 2012.04.17
申请人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 HWANG, HYUN SANG;KIM, SEONG HYUN;XINJUN LIU
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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