发明名称 |
RESISTANCE CHANGE MEMORY DEVICE HAVING THRESHOLD SWITCHING AND MEMORY SWITCHING CHARACTERS, FABRICATION METHOD FOR THE SAME, AND RESISTANCE CHANGE MEMORY DEVICE ARRAY HAVING THE SAME |
摘要 |
<p>PURPOSE: A resistance variation memory device, a manufacturing method, and a resistance variation memory device array are provided to read programmed data by including a hybrid switching film including a switching characteristic and a memory switching characteristic. CONSTITUTION: A plurality of first electrodes (110) is arranged to a first direction on a circuit board (100). An insulation film (120) is formed on the first electrode. A hybrid switching film (135) is arranged between the first electrode and a second electrode (140). The hybrid switching film includes a memory switching film (135b) including a memory switching and a threshold switching film (135a) including a threshold switching characteristic. The threshold switching film includes a metal-insulator transfer characteristic.</p> |
申请公布号 |
KR20130117380(A) |
申请公布日期 |
2013.10.28 |
申请号 |
KR20120039566 |
申请日期 |
2012.04.17 |
申请人 |
GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
HWANG, HYUN SANG;KIM, SEONG HYUN;XINJUN LIU |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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