发明名称 ABNORMALITY INSPECTION METHOD AND ABNORMALITY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an abnormality inspection method for inspecting a test object without complicating a device.SOLUTION: There is provided an abnormality inspection method including processes of: acquiring a vibration signal according to vibration of a rotor detected by a first sensor from the first sensor; executing an allophone inspection of the rotor on the basis of the vibration signal from the first sensor; calculating rotation speed of the rotor from the vibration signal from the first sensor; acquiring an AE signal according to AE to be generated in the rotor, detected by an AE sensor from the AE sensor; detecting a specific AE signal to be generated by rotation of the rotor on the basis of the rotation speed and the AE signal; executing an AE inspection of the rotor on the basis of the specific AE signal; and determining presence/absence of an abnormality of the rotor on the basis of results of the allophone inspection and the AE inspection.
申请公布号 JP2013221877(A) 申请公布日期 2013.10.28
申请号 JP20120094343 申请日期 2012.04.18
申请人 PANASONIC CORP 发明人 MIYAWAKI KENJI;OMORI YUTAKA
分类号 G01H17/00 主分类号 G01H17/00
代理机构 代理人
主权项
地址