发明名称 |
METHOD FOR PRODUCTION OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
摘要 |
<p>This method for production of a semiconductor device is provided with a step of preparing a mask (212) on the principal surface (202) of a semiconductor substrate (200) or on the back surface (204) on the opposite side thereof. The semiconductor substrate (200) is provided on the principal surface (202) with an element region (206), and may also be provided with a non-element section between the principal surface (202) and the back surface (204). The method is further provided with a step of performing ion exposure of the mask (212) and the semiconductor substrate (200) from the mask side to form a high-resistance layer (222).</p> |
申请公布号 |
WO2013157183(A1) |
申请公布日期 |
2013.10.24 |
申请号 |
WO2013JP01304 |
申请日期 |
2013.03.04 |
申请人 |
S.H.I. EXAMINATION & INSPECTION, LTD. |
发明人 |
INOUE, TAKESHI;SAKANE, HITOSHI;MASAOKA, AKINORI |
分类号 |
H01L21/265;H01L21/76 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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