发明名称 SEMICONDUCTOR PROCESS
摘要 A semiconductor process includes the following steps. A gate structure is formed on a substrate. An oxide layer is formed and covers the gate structure and the substrate. A plasma process without oxygen is performed to densify the oxide layer. A material layer is formed and covers the oxide layer. The material layer and the oxide layer are etched to form a dual spacer.
申请公布号 US2013280878(A1) 申请公布日期 2013.10.24
申请号 US201213451484 申请日期 2012.04.19
申请人 WEN TSAI-YU;LU TSUO-WEN;WANG YU-REN 发明人 WEN TSAI-YU;LU TSUO-WEN;WANG YU-REN
分类号 H01L21/336 主分类号 H01L21/336
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