| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus, a method etc. for simple and efficient delay measurement.SOLUTION: A method and circuit for providing on-chip measurement of delay between two signals includes first and second delay chains (241, 242) having different delay values connected to sampling latches (222-227) which each include a data input coupled between adjacent delay elements of the first delay chain and a clock input coupled between adjacent delay elements of the second delay chain, thereby capturing a high precision delay measurement for the signals. |
