发明名称 |
SEMICONDUCTOR WAFER AND METHOD FOR AUTO-CALIBRATING INTEGRATED CIRCUIT CHIPS USING PLL AT WAFER LEVEL |
摘要 |
In integrated circuit chips that are used for RFID, a method of calibrating an operation frequency that is generated in an operation frequency generator and a semiconductor wafer including a calibration circuit are provided. The method of calibrating an operation frequency of integrated circuit chips includes: supplying DC power to the integrated circuit chips; selecting an integrated circuit chip to perform calibration of an operation frequency; receiving an operation frequency that is generated in the selected integrated circuit chip; calculating a difference between a phase of the operation frequency and a phase of a calibration target frequency; generating a frequency calibration value of the operation frequency using the phase difference; transmitting a control signal including the frequency calibration value to the integrated circuit chip; and releasing a selection of the integrated circuit chip in which calibration of the operation frequency is complete.
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申请公布号 |
US2013278309(A1) |
申请公布日期 |
2013.10.24 |
申请号 |
US201213605554 |
申请日期 |
2012.09.06 |
申请人 |
KIM HYUNSEOK;CHOI SU NA;LEE HEYUNG SUB;PYO CHEOL SIG;ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
KIM HYUNSEOK;CHOI SU NA;LEE HEYUNG SUB;PYO CHEOL SIG |
分类号 |
H03L7/06 |
主分类号 |
H03L7/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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