| 摘要 |
PROBLEM TO BE SOLVED: To provide a fault location diagnosis device which extracts a fault classified as a systematic fault from a test result of a semiconductor integrated circuit that is determined to be defective, thereby facilitating feedback to a manufacturing process.SOLUTION: A fault location diagnosis device includes: a layout characteristic retrieval area calculation unit that calculates a plurality of layout characteristic retrieval areas having each of a plurality of single fault, which are included in multiple faults, as a base point; a layout characteristic extraction unit that extracts a predetermined characteristic as a layout characteristic from constituents that are included in the plurality of layout characteristic retrieval areas; and a fault type determination unit that determines that a systematic fault exists in a semiconductor integrated circuit under test if a layout characteristic common to the plurality of layout characteristic retrieval areas exists. |
