发明名称 FABRICATING METHOD OF THIN FILM TRANSISTOR
摘要 A thin film transistor including a substrate, a semiconductor layer, a patterned doped semiconductor layer, a source and a drain, a gate insulation layer, and a gate is provided. The semiconductor layer is disposed on the substrate. The patterned doped semiconductor layer is disposed on opposite sides of the semiconductor layer. The source and the drain are disposed on the patterned doped semiconductor layer and the opposite sides of the semiconductor layer, wherein a part of the semiconductor layer covered by the source and the drain has a first thickness, a part of the semiconductor layer disposed between the source and the drain and not covered by the source and the drain has a second thickness ranging from 200 Å to 800 Å. The gate insulation layer is disposed on the source, the drain and the semiconductor layer. The gate is disposed on the gate insulation layer.
申请公布号 US2013280868(A1) 申请公布日期 2013.10.24
申请号 US201313923384 申请日期 2013.06.21
申请人 AU OPTRONICS CORPORATION 发明人 CHEN CHANG-KEN
分类号 H01L29/66 主分类号 H01L29/66
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