| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection system which can progress an examination received from outside, in which an examination order of a subject to be examined, which has been selected by mistake to progress the examination, can be changed easily during the examination.SOLUTION: An examination order having been selected by mistake can be changed easily after the start of an examination, and the change of the examination order is controlled in consideration of the transition of photographed images and the consistency of examination execution information with external devices upon the change of the examination order. |
