发明名称 PATTERN MATCHING METHOD AND APPARATUS
摘要 When the degree of matching between patterns decreases due to a pattern fluctuation or an appearance fluctuation that has occurred during manufacturing steps, a heavy work burden would be placed on an operator. A data processing unit of a pattern matching apparatus calculates a threshold for determination of matching between a first template image and a partial region of a search target image obtained by capturing an image of the surface of a sample, on the basis of a result of evaluation of a similarity between the search target image and a second template image, the second template image having been captured in a wider range than the first template image.
申请公布号 US2013278748(A1) 申请公布日期 2013.10.24
申请号 US201313783333 申请日期 2013.03.03
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 NAKAYAMA HIDEKI;SAKAMOTO MASASHI
分类号 G06K9/00 主分类号 G06K9/00
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