发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To completely recover Vth of a gate insulating film to Vth of a gate oxide film.SOLUTION: A method for manufacturing a semiconductor device includes the steps of: preparing a silicon substrate; ion-implanting fluorine into the silicon substrate; forming a gate insulating film containing a nitride layer on a surface of the silicon substrate; post-annealing the silicon substrate in a nitrogen atmosphere: and annealing the silicon substrate in a hydrogen atmosphere.
申请公布号 JP2013219214(A) 申请公布日期 2013.10.24
申请号 JP20120089011 申请日期 2012.04.10
申请人 ELPIDA MEMORY INC 发明人 WAKABAYASHI MAKOTO
分类号 H01L21/336;H01L21/316;H01L21/318;H01L21/8234;H01L21/8242;H01L27/088;H01L27/108;H01L29/78 主分类号 H01L21/336
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