发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To completely recover Vth of a gate insulating film to Vth of a gate oxide film.SOLUTION: A method for manufacturing a semiconductor device includes the steps of: preparing a silicon substrate; ion-implanting fluorine into the silicon substrate; forming a gate insulating film containing a nitride layer on a surface of the silicon substrate; post-annealing the silicon substrate in a nitrogen atmosphere: and annealing the silicon substrate in a hydrogen atmosphere. |
申请公布号 |
JP2013219214(A) |
申请公布日期 |
2013.10.24 |
申请号 |
JP20120089011 |
申请日期 |
2012.04.10 |
申请人 |
ELPIDA MEMORY INC |
发明人 |
WAKABAYASHI MAKOTO |
分类号 |
H01L21/336;H01L21/316;H01L21/318;H01L21/8234;H01L21/8242;H01L27/088;H01L27/108;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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