发明名称 INSPECTION METHOD FOR CHIP-EMBEDDED PRINTED CIRCUIT BOARD
摘要 PURPOSE: A method for inspecting a printed circuit board of a built in chip type is provided to accurately measure by comparing raw data with a measured distance. CONSTITUTION: A substrate is comprised of a copper circuit (10) and a resin insulating layer. A cavity (20) is formed at the substrate. The chip is mounted at the cavity. The station coordinate of the x and y of a cavity shied (21) is detected. The station coordinate of the x and y of the chip is detected.
申请公布号 KR101321123(B1) 申请公布日期 2013.10.23
申请号 KR20120017781 申请日期 2012.02.22
申请人 发明人
分类号 G01B11/03;H05K3/46;H05K13/08 主分类号 G01B11/03
代理机构 代理人
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