发明名称 X-ray analysis apparatus
摘要 An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.
申请公布号 GB201316060(D0) 申请公布日期 2013.10.23
申请号 GB20130016060 申请日期 2013.09.10
申请人 RIGAKU CORPORATION 发明人
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