发明名称 Capacitors including a rutile titanium dioxide material and semiconductor devices incorporating same
摘要 Methods of forming a capacitor including forming at least one aperture in a support material, forming a titanium nitride material within the at least one aperture, forming a ruthenium material within the at least one aperture over the titanium nitride material, and forming a first conductive material over the ruthenium material within the at least one aperture. The support material may then be removed and the titanium nitride material may be oxidized to form a titanium dioxide material. A second conductive material may then be formed over an outer surface of the titanium dioxide material. Capacitors, semiconductor devices and methods of forming a semiconductor device including the capacitors are also disclosed.
申请公布号 US8564095(B2) 申请公布日期 2013.10.22
申请号 US201113021910 申请日期 2011.02.07
申请人 HUANG TSAI-YU;BHAT VISHWANATH;ANTONOV VASSIL;HSIEH CHUN-I;CARLSON CHRIS;MICRON TECHNOLOGY, INC. 发明人 HUANG TSAI-YU;BHAT VISHWANATH;ANTONOV VASSIL;HSIEH CHUN-I;CARLSON CHRIS
分类号 H01L21/02 主分类号 H01L21/02
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