发明名称 System and method for accelerated ray-box intersection testing
摘要 A method for performing a ray-box intersection test includes forming a span extending between a first plane-ray intersection point and a second plane-ray intersection point, and increasing the span by relocating to a new position at least one of the first and second plane-ray intersection points. A box intersection span is constructed using the increased span, and the box intersection span, which corresponds to a node in a hierarchical acceleration structure, is tested for intersection with the ray.
申请公布号 US8564589(B1) 申请公布日期 2013.10.22
申请号 US20100780964 申请日期 2010.05.17
申请人 AILA TIMO;LAINE SAMULI;LINDHOLM JOHN ERIK;NVIDIA CORPORATION 发明人 AILA TIMO;LAINE SAMULI;LINDHOLM JOHN ERIK
分类号 G06T15/00;G06T15/40;G06T17/20;G06T19/00 主分类号 G06T15/00
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