发明名称 Method for manufacturing semiconductor device
摘要 A manufacturing method of a semiconductor device of which cost can be suppressed by using a nanoimprinting method is provided. In the invention, a gate insulating film, a conductive film, and a resist are formed in sequence over a semiconductor film and a resist is hardened while pressing a mold formed with a pattern to the resist. Therefore, the pattern is transferred to the resist, the surface of the resist to which the pattern is transferred is ashed until a part of the conductive film is exposed, the resist having the ashed surface is used a mask, and the conductive film is etched.
申请公布号 US8563438(B2) 申请公布日期 2013.10.22
申请号 US20090648545 申请日期 2009.12.29
申请人 MAEKAWA SHINJI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MAEKAWA SHINJI
分类号 H01L21/302;G03F7/00;H01L21/3213;H01L21/461;H01L21/77;H01L21/8238;H01L21/84 主分类号 H01L21/302
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