HANDLING SYSTEM FOR SEMICONDUCTOR DEVICE

摘要

PURPOSE: A semiconductor device handling system is provided to improve the manufacturing yield of a semiconductor device by preventing a work time delay even when there is a difference in time required to perform each of a loading process, a test process, and an unloading process. CONSTITUTION: A semiconductor device handling system (1) includes test units (2), a loading unit (3), an unloading unit (4), and a transport unit (5). The loading unit performs a loading process for disposing a target semiconductor device in a test tray. The unloading unit performs an unloading process for separating the tested semiconductor device from the test tray. The transport unit is installed between the loading unit and the unloading unit, and transports the test tray. The plural test units perform test processes for connecting the semiconductor device, disposed in the test tray, to test equipment. The test units are installed along the transport unit between the loading unit and the unloading unit.