发明名称 Semiconductor devices including gate structures comprising colossal magnetocapacitive materials
摘要 Semiconductor devices include a transistor having a gate structure located close to a channel region that comprises a colossal magnetocapacitive material. The gate structure is configured to affect electrical current flow through the channel region between a source and a drain. The colossal magnetocapacitive material optionally may be disposed between two structures, one or both of which may be electrically conductive, magnetic, or both electrically conductive and magnetic. Methods of fabricating semiconductor devices include forming a colossal magnetocapacitive material close to a channel region between a source and a drain of a transistor, and configuring the colossal magnetocapacitive material to exhibit colossal magnetocapacitance for generating an electrical field in the channel region. Methods of affecting current flow through a transistor include causing a colossal magnetocapacitive material to exhibit colossal magnetocapacitance and generate an electrical field in a channel region of a transistor.
申请公布号 US8564039(B2) 申请公布日期 2013.10.22
申请号 US20100755940 申请日期 2010.04.07
申请人 SANDHU GURTEJ S.;MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ S.
分类号 H01L29/78;H01L29/82 主分类号 H01L29/78
代理机构 代理人
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