| 摘要 |
PROBLEM TO BE SOLVED: To provide: a test method that can prevent generation of a hazard and the like when switching between a clock signal from automatic test equipment and a clock signal from a clock generation circuit and can suppress the increase of test patterns; and a semiconductor device.SOLUTION: A clock signal switching control unit 5 of a semiconductor device 2 that is a device under test inputs a stabilization completion signal which indicates that the stabilization of a clock signal of a clock generation circuit 4 is complete and a test data transfer signal which indicates that the transfer of test data from automatic test equipment 1 to the semiconductor device 2 side is complete. When detecting that both of them are in an active state, the unit stops the supply of a test clock signal TCLK which has been supplied so far at first timing, performs switching so as to select the output of a second clock gating circuit, supplies the clock signal from the clock generation circuit to a selector, and outputs it as a clock signal supplied to a CPU and internal block 12. |
