发明名称 Lithographic Apparatus, Substrate and Device Manufacturing Method
摘要 A method uses a lithographic apparatus to form an inspection target structure upon a substrate. The method comprises forming the periphery of the inspection target structure so as to provide a progressive optical contrast transition between the inspection target structure and its surrounding environment. This may be achieved by providing a progressive change in the optical index at the periphery of the target structure.
申请公布号 US2013271740(A1) 申请公布日期 2013.10.17
申请号 US201313853407 申请日期 2013.03.29
申请人 ASML NETHERLANDS B.V. 发明人 QUINTANILHA RICHARD
分类号 G03F1/00;G01N21/93 主分类号 G03F1/00
代理机构 代理人
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