发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of including a low-voltage diode instead of a high-voltage diode to detect the inter-collector-emitter voltage of an insulated-gate bipolar transistor (IGBT).SOLUTION: A semiconductor device includes a wideband gap semiconductor substrate 12, and a MOS transistor T and a diode D are monolithically formed on the wideband gap semiconductor substrate 12. The transistor has a source terminal ST as a first terminal, a drain terminal DT as a second terminal, and a gate terminal. The diode D detects a voltage between the first terminal and the second terminal of the transistor.
申请公布号 JP2013214597(A) 申请公布日期 2013.10.17
申请号 JP20120083720 申请日期 2012.04.02
申请人 SUMITOMO ELECTRIC IND LTD 发明人 HIRAKATA NOBUYUKI
分类号 H01L27/04;H01L21/8234;H01L27/06;H01L27/088;H01L29/06;H01L29/12;H01L29/78 主分类号 H01L27/04
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