发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus which can prevent quality deterioration in treatment for forming a coating film on a wafer.SOLUTION: A substrate processing apparatus comprises: a coating treatment unit 31; a heat treatment unit 41; a first main transfer mechanism Tfor transferring a wafer W with respect to respective treatment units 31, 41; a second main transfer mechanism Tto which the wafer W is transferred from the first main transfer mechanism Tvia a placement part PASS; and a buffer part BF2 on which the wafer W is placed when the wafer W cannot be placed on the placement part PASS. By doing this, the first main transfer mechanism Tcan continue to transfer the wafer W. Accordingly, other wafers W in respective treatment units 31, 41 are transferred between the treatment units 31, 41 without delay, and a series of treatments including coating treatment and heat treatment is performed as scheduled. As a result, quality deterioration in treatment for forming a coating film on the wafer W.
申请公布号 JP2013214756(A) 申请公布日期 2013.10.17
申请号 JP20130105114 申请日期 2013.05.17
申请人 SOKUDO CO LTD 发明人 OGURA HIROYUKI;MIHASHI TAKESHI;FUKUTOMI YOSHIMITSU;MORINISHI TAKEYA;KAWAMATSU YASUO;NAGASHIMA KOJI
分类号 H01L21/027;B05C9/14;B05C13/00;B65G49/07;G03F7/16;H01L21/677 主分类号 H01L21/027
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