发明名称 RESISTANCE CHANGE MEMORY DEVICE HAVING THRESHOLD SWITCHING AND MEMORY SWITCHING CHARACTERISTICS, METHOD OF FABRICATING THE SAME, AND RESISTANCE CHANGE MEMORY DEVICE INCLUDING THE SAME
摘要 Disclosed are a resistance change memory device, a method of fabricating the same, and a resistance change memory array including the same. The resistance change memory device includes a first electrode and a second electrode. A hybrid switching layer is interposed between the first electrode and the second electrode. The hybrid switching layer is a metal oxide layer having both threshold switching characteristics and memory switching characteristics.
申请公布号 US2013270509(A1) 申请公布日期 2013.10.17
申请号 US201313864548 申请日期 2013.04.17
申请人 HWANG HYUNSANG;KIM SEONGHYUN;LIU XINJUN;GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 HWANG HYUNSANG;KIM SEONGHYUN;LIU XINJUN
分类号 H01L45/00 主分类号 H01L45/00
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