| 摘要 |
The invention relates to a method for locating a defect in an electrochemical store (165). The method comprises the following steps: controlling the temperature of a subsection (145, 150, 155, 160, 170) of the electrochemical store (165) in order to increase internal pressure in the subsection (145, 150, 155, 160, 170); recording a measured value that represents a leak of a component from the subsection (145, 150, 155, 160, 170), occurring in response to the increased internal pressure in the subsection (145, 150, 155, 160, 170); and locating the defect in the subsection (145, 150, 155, 160, 170) if the measured value is in a predefined relation to a reference value. |
