发明名称 LITHOGRAPHIC APPARATUS, SUBSTRATE AND DEVICE MANUFACTURING METHOD BACKGROUND.
摘要 A method uses a lithographic apparatus to form an inspection target structure upon a substrate. The method comprises forming the periphery of the inspection target structure so as to provide a progressive optical contrast transition between the inspection target structure and its surrounding environment. This may be achieved by providing a progressive change in the optical index at the periphery of the target structure.
申请公布号 NL2010458(A) 申请公布日期 2013.10.17
申请号 NL20132010458 申请日期 2013.03.15
申请人 ASML NETHERLANDS B.V. 发明人 QUINTANILHA RICHARD
分类号 G03F7/20 主分类号 G03F7/20
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