发明名称 ELECTRONIC PANEL INSPECTION DEVICE
摘要 <p>Provided is an electronic panel inspection device that enables precise inspection of an electrical current state of an electronic panel, reducing an error in a comparison value caused by an error in initial output signals of a pair of sensors. The invention is the electronic panel inspection device (100), which inspects the electrical current state of the electronic panel, provided with: the pair of sensors (10), which output signals corresponding to a physical quantity that expresses a change in the electrical current state of the electronic panel; a comparison value computation means (20) that computes the comparison value, which is of the output signals of the pair of sensors (10); an assessment means (30) that on the basis of the comparison value computed by the comparison value computation means (20), assesses the electrical current state of the electronic panel; and a correction means (40) that inputs a correction signal to at least one sensor of the pair of sensors (10) on the basis of the comparison value computed by the comparison value computation means (20), and so as to reduce the comparison value for a non-inspection time, corrects the output signal of the sensor to which the correction signal was input.</p>
申请公布号 WO2013153615(A1) 申请公布日期 2013.10.17
申请号 WO2012JP59768 申请日期 2012.04.10
申请人 INTERNATIONAL TEST & ENGINEERING SERVICES CO., LTD.;IKEDA TERUO 发明人 IKEDA TERUO
分类号 G01R31/00;G01R31/02;H01L31/04 主分类号 G01R31/00
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