发明名称 PROBE DEVICE AND MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To surely and easily bring a probe body into contact with a measuring object and, in that state, perform an operation of respective types of operation switches.SOLUTION: A probe device comprises a probe support member 21 including: a probe mounting section 32 in which a pair of probe bodies 22a and 22b are disposed in a mutually separated state; and a support member body 31 in which the probe mounting section 32 is mounted on one end thereof. Both the probe bodies 22a and 22b are mounted on the probe mounting section 32 to be movable in approaching/separating directions for mutually approaching/separating. The probe mounting section 32 is mounted on one end of the support member body 31 so as to change in intersection angle between a first virtual line formed by connecting tip ends of both the probe bodies 22a and 22b and a central line along the longitudinal direction of the support member body 31.
申请公布号 JP2013213770(A) 申请公布日期 2013.10.17
申请号 JP20120084916 申请日期 2012.04.03
申请人 HIOKI EE CORP 发明人 YOSHIIKE TETSUYA
分类号 G01R1/06;G01R31/36 主分类号 G01R1/06
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